Silicon Yield Analytics Platform

An end-to-end data analytics platform for monitoring and optimizing semiconductor mass production yields across global fabs and test houses. Ingests streaming test data from UltraFlex systems via KQL pipelines into a relational database. PowerBI dashboards provide real-time visibility into yield trends, bin distributions, and parametric shifts. JMP statistical models identify correlations between process variations and yield loss. Stakeholders across engineering, operations, and management use the platform to make data-driven decisions on test limits, process adjustments, and cost optimization. Reduced yield excursion detection time from days to under 2 hours.