LLM-Powered Root Cause Analysis Engine

A Large Language Model integration that automates and accelerates root-cause analysis for silicon test failures. Connects to massive historical test report databases and failure logs, enabling engineers to query years of troubleshooting data using natural language. Instead of manually searching through thousands of reports, the team asks questions like "What caused yield drops on Product X at Fab Y in Q3?" and gets synthesized answers with cited sources. Also automates technical documentation generation from structured test data, cutting report preparation time by over 60%.